You Searched For: Graticules, Reticles and Grids

Catalog Number: (102773-584)

Supplier: Electron Microscopy Sciences

Description: The 3 post copper lift-out grids include multiple indexed mounting locations with both vertical bars and 'V' shaped attachment surfaces.

Supplier: Electron Microscopy Sciences

Description: High quality, precision made standard reticles are manufactured to use with our microscope eyepieces. All recticles are chrome on glass and positive polarity.

Supplier: Electron Microscopy Sciences

Description: Unique index grids for all microscopy work, are manufactured in the strictest accordance to meet AHERA requirements.

Supplier: Electron Microscopy Sciences

Description: These can be used for two-way measurement when calibrated as a micrometer.

Supplier: Electron Microscopy Sciences

Description: These scales are used for the measuring of lengths of specimen or distances between points on a variety of different shaped objects.

Supplier: Electron Microscopy Sciences

Description: High quality, precision made standard reticles are manufactured to use with our microscope eyepieces. All recticles are chrome on glass and positive polarity.

Supplier: Electron Microscopy Sciences

Description: A thin film of pure formvar resin coats the shiny side of a square grid.

Supplier: ELECTRON MICROSCOPY SCIENCE

Description: Pure silicon TEM windows feature imaging windows with 5 to 35 nm thickness, reducing background contribution and interference for higher contrast imaging. Most impressively, 5 nm thick non-porous pure silicon TEM Windows are thinner than the thinnest commercially available amorphous carbon membranes.

Catalog Number: (76439-544)

Supplier: ELECTRON MICROSCOPY SCIENCE

Description: Suspended germanium provides a unique calibration standard for x-ray energy dispersive spectroscopy. Since Ge is not typically found in TEM columns, the calibration samples provide a material that cannot be mistaken for instrument components and their signal peaks. The regime in which system peaks normally occur (2 to 9 keV and 11 to 20 keV) is devoid of peaks from the Ge.

Supplier: Electron Microscopy Sciences

Description: Maxtaform grids with reference patterns are of the highest consistent quality, with a wide choice to choose from to suit all of your particular needs.

Supplier: Electron Microscopy Sciences

Description: Veco Grids offer superior handling characteristics

Supplier: Electron Microscopy Sciences

Description: Veco Grids offer superior handling characteristics

Supplier: Electron Microscopy Sciences

Description: These scales are available in two different sizes, for use with the measuring magnifiers.

Supplier: Electron Microscopy Sciences

Description: Thin Bar Grids have been developed using a new technology to produce ultra-fine grids with thinner cross bars than regular grids. The result is equally firm specimen support but with 40% more open area for viewing maximum specimen surface area.

Supplier: Electron Microscopy Sciences

Description: Veco Grids offer superior handling characteristics.

Supplier: Electron Microscopy Sciences

Description: Mainly used to estimate the three-dimensional surface areas or the surface density of a component in a given volume, when the component does not have a random orientation.