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Product Image-100488-090

Biological set w/25mm dia block-18 st

Catalog Number: 100488-090
Supplier: Electron Microscopy Sciences

Minority or Woman-Owned Business Enterprise


Product Image-76439-548

SiO X-Ray Window, Substrates for x-ray microscopy and x-ray spectroscopy are flat, uniformly deposited films with consistent backgrounds with low field-to-field variability and high x-ray transmission, For correlative optical and x-ray microscopy, 500um Dimension square, Membrane thickness: 300nm

Description: SiO X-Ray Window, Substrates for x-ray microscopy and x-ray spectroscopy are flat, uniformly deposited films with consistent backgrounds with low field-to-field variability and high x-ray transmission, For correlative optical and x-ray microscopy, 500um Dimension square, Membrane thickness: 300nm
Catalog Number: 76439-548
Supplier: ELECTRON MICROSCOPY SCIENCE
Product Image-76439-556

Silicon Nitride X-Ray Window, Substrates for x-ray microscopy and x-ray spectroscopy are flat, uniformly deposited films with backgrounds with low field-to-field variability and high x-ray transmission, For high temp and differential pressure environments, Window dimension: 1000um, Membrane: 100nm

Description: Silicon Nitride X-Ray Window, Substrates for x-ray microscopy and x-ray spectroscopy are flat, uniformly deposited films with backgrounds with low field-to-field variability and high x-ray transmission, For high temp and differential pressure environments, Window dimension: 1000um, Membrane: 100nm
Catalog Number: 76439-556
Supplier: ELECTRON MICROSCOPY SCIENCE
Product Image-76439-550

Silicon Nitride X-Ray Window, Substrates for x-ray microscopy and x-ray spectroscopy are flat, uniformly deposited films with backgrounds with low field-to-field variability and high x-ray transmission, For high temp and differential pressure environments, Window dimension: 500um, Membrane: 50nm

Description: Silicon Nitride X-Ray Window, Substrates for x-ray microscopy and x-ray spectroscopy are flat, uniformly deposited films with backgrounds with low field-to-field variability and high x-ray transmission, For high temp and differential pressure environments, Window dimension: 500um, Membrane: 50nm
Catalog Number: 76439-550
Supplier: ELECTRON MICROSCOPY SCIENCE
Product Image-76439-560

Silicon Nitride X-Ray Window, Substrates for x-ray microscopy and x-ray spectroscopy are flat, uniformly deposited films with backgrounds with low field-to-field variability and high x-ray transmission, For high temp and differential pressure environments, Window dimension: 2500um, Membrane: 200nm

Description: Silicon Nitride X-Ray Window, Substrates for x-ray microscopy and x-ray spectroscopy are flat, uniformly deposited films with backgrounds with low field-to-field variability and high x-ray transmission, For high temp and differential pressure environments, Window dimension: 2500um, Membrane: 200nm
Catalog Number: 76439-560
Supplier: ELECTRON MICROSCOPY SCIENCE
Product Image-76439-558

Silicon Nitride X-Ray Window, Substrates for x-ray microscopy and x-ray spectroscopy are flat, uniformly deposited films with backgrounds with low field-to-field variability and high x-ray transmission, For high temp and differential pressure environments, Window dimension: 1500um, Membrane: 200nm

Description: Silicon Nitride X-Ray Window, Substrates for x-ray microscopy and x-ray spectroscopy are flat, uniformly deposited films with backgrounds with low field-to-field variability and high x-ray transmission, For high temp and differential pressure environments, Window dimension: 1500um, Membrane: 200nm
Catalog Number: 76439-558
Supplier: ELECTRON MICROSCOPY SCIENCE
Product Image-76439-552

Silicon Nitride X-Ray Window, Substrates for x-ray microscopy and x-ray spectroscopy are flat, uniformly deposited films with backgrounds with low field-to-field variability and high x-ray transmission, For high temp and differential pressure environments, Window dimension: 100um, Membrane: 50nm

Description: Silicon Nitride X-Ray Window, Substrates for x-ray microscopy and x-ray spectroscopy are flat, uniformly deposited films with backgrounds with low field-to-field variability and high x-ray transmission, For high temp and differential pressure environments, Window dimension: 100um, Membrane: 50nm
Catalog Number: 76439-552
Supplier: ELECTRON MICROSCOPY SCIENCE
Product Image-76439-554

Silicon Nitride X-Ray Window, Substrates for x-ray microscopy and x-ray spectroscopy are flat, uniformly deposited films with backgrounds with low field-to-field variability and high x-ray transmission, For high temp and differential pressure environments, Window dimension: 500um, Membrane: 100nm

Description: Silicon Nitride X-Ray Window, Substrates for x-ray microscopy and x-ray spectroscopy are flat, uniformly deposited films with backgrounds with low field-to-field variability and high x-ray transmission, For high temp and differential pressure environments, Window dimension: 500um, Membrane: 100nm
Catalog Number: 76439-554
Supplier: ELECTRON MICROSCOPY SCIENCE
Product Image-100495-112

Selinium single standard

Catalog Number: 100495-112
Supplier: Electron Microscopy Sciences

Minority or Woman-Owned Business Enterprise


Product Image-100495-102

Rhenium single standard

Catalog Number: 100495-102
Supplier: Electron Microscopy Sciences

Minority or Woman-Owned Business Enterprise


Product Image-100495-116

Tin single standard

Catalog Number: 100495-116
Supplier: Electron Microscopy Sciences

Minority or Woman-Owned Business Enterprise


Product Image-100495-044

Boron single standard

Catalog Number: 100495-044
Supplier: Electron Microscopy Sciences

Minority or Woman-Owned Business Enterprise


Product Image-100495-054

Beryllium single standard

Catalog Number: 100495-054
Supplier: Electron Microscopy Sciences

Minority or Woman-Owned Business Enterprise


Product Image-100495-072

Germanium single standard

Catalog Number: 100495-072
Supplier: Electron Microscopy Sciences

Minority or Woman-Owned Business Enterprise


Product Image-100495-056

Bismuth single standard

Catalog Number: 100495-056
Supplier: Electron Microscopy Sciences

Minority or Woman-Owned Business Enterprise


Product Image-100495-038

Aluminum single standard

Catalog Number: 100495-038
Supplier: Electron Microscopy Sciences

Minority or Woman-Owned Business Enterprise


161 - 176 of 26,257