Acetic acid glacial ≥99.7% (by freezing point), CMOS for microelectronic, J.T.Baker®
Supplier: AVANTOR PERFORMANCE MATERIALS US
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Danger
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Management of Change (MOC) category = R
9503-03
9503-05
JT9503-3CS
334.09
USD
JT9503-3
JT9503-5
Acetic acid glacial ≥99.7% (by freezing point), CMOS for microelectronic, J.T.Baker®
Acetic acid
Formula:
H₃CCOOH Boiling Pt: 118 °C (1013 hPa) Melting Pt: 17 °C Density: 1.05 g/cm³ (20 °C) Flash Pt: 38.5 °C Storage Temperature: Ambient |
MDL Number:
MFCD00036152 CAS Number: 64-19-7 EINECS: 200-580-7 UN: 2789 ADR: 8,II REACH: 01-2119475328-30 |
Specification Test Results
For Microelectronic Use | |
IMPORTANT: Material will freeze if stored below 17 °C (63°F). | |
Assay (CH₃COOH) (by freezing point) | ≥99.7 % |
Color (APHA) | ≤10 |
Acetic Anhydride ((CH₃CO)₂O) | ≤0.01 % |
Acetaldehyde | ≤0.05 % |
Residue after Evaporation | ≤4 ppm |
Solubility in H₂O | Passes Test |
Specific Gravity at 20°/20°C | ≥1.048 |
Substances Reducing Dichromate | Passes Test |
Substances Reducing Permanganate | Passes Test |
Chloride (Cl) | ≤0.5 ppm |
Phosphate (PO₄) | ≤0.5 ppm |
Sulfate (SO₄) | ≤0.5 ppm |
Trace Impurities - Aluminum (Al) | ≤50.0 ppb |
Arsenic and Antimony (as As) | ≤5.0 ppb |
Trace Impurities - Barium (Ba) | ≤10.0 ppb |
Trace Impurities - Beryllium (Be) | ≤10.0 ppb |
Trace Impurities - Bismuth (Bi) | ≤50 ppb |
Trace Impurities - Boron (B) | ≤10.0 ppb |
Trace Impurities - Cadmium (Cd) | ≤10.0 ppb |
Trace Impurities - Calcium (Ca) | ≤200.0 ppb |
Trace Impurities - Chromium (Cr) | ≤30.0 ppb |
Trace Impurities - Cobalt (Co) | ≤10.0 ppb |
Trace Impurities - Copper (Cu) | ≤20.0 ppb |
Trace Impurities - Gallium (Ga) | ≤10.0 ppb |
Trace Impurities - Germanium (Ge) | ≤10.0 ppb |
Trace Impurities - Gold (Au) | ≤10.0 ppb |
Heavy Metals (as Pb) | ≤300.0 ppb |
Trace Impurities - Iron (Fe) | ≤100.0 ppb |
Trace Impurities - Lead (Pb) | ≤100 ppb |
Trace Impurities - Lithium (Li) | ≤10.0 ppb |
Trace Impurities - Magnesium (Mg) | ≤50.0 ppb |
Trace Impurities - Manganese (Mn) | ≤10.0 ppb |
Trace Impurities - Molybdenum (Mo) | ≤10.0 ppb |
Trace Impurities - Nickel (Ni) | ≤25.0 ppb |
Trace Impurities - Niobium (Nb) | ≤10.0 ppb |
Trace Impurities - Potassium (K) | ≤100 ppb |
Trace Impurities - Silicon (Si) | ≤50 ppb |
Trace Impurities - Silver (Ag) | ≤10.0 ppb |
Trace Impurities - Sodium (Na) | ≤100.0 ppb |
Trace Impurities - Strontium (Sr) | ≤10.0 ppb |
Trace Impurities - Tantalum (Ta) | ≤10.0 ppb |
Trace Impurities - Thallium (Tl) | ≤50.0 ppb |
Trace Impurities - Tin (Sn) | ≤50 ppb |
Trace Impurities - Titanium (Ti) | ≤100.0 ppb |
Trace Impurities - Vanadium (V) | ≤10.0 ppb |
Trace Impurities - Zinc (Zn) | ≤50 ppb |
Trace Impurities - Zirconium (Zr) | ≤10.0 ppb |
Particle Count - 1.0 µm and greater | ≤10 par/ml |
For additional information, go to www.askavantor.com. Search keywords | |
freezing" and product name." |
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