Silicon Dioxide TEM Window Grids, Electron Microscopy Sciences

Supplier: ELECTRON MICROSCOPY SCIENCE
76042-90 76042-91 76042-92
76439-608PK 477.94 USD
76439-608 76439-610 76439-612
Silicon Dioxide TEM Window Grids, Electron Microscopy Sciences
Graticules, Reticles and Grids
By making the grids slightly narrower users now have easy access to grids in TEM holders. No more fumbling with tweezers while trying to pick up or put down grids. The new TEM Window grid shape is still compatible with all standard holders. TEM Window dimensions are 2.9 mm in diameter and 100 µm thick.

  • Plasma cleanable - can be vigorously plasma cleaned to remove organic contamination
  • Field to field uniformity - reduced variability
  • Tolerates temperatures above 1000 °C - supports use in environmental TEMs where dynamic processes are observed at high temperatures
  • Withstands harsh conditions - Provides an ideal balance of imaging resolution, chemical stability and mechanical strength
  • Incorporates stoichiometric silicon dioxide - offers the ability to analyze for nitrogen by EDX techniques

Specifications: 100 µm thick frame, fits 3 mm sample holders.

Non-porous films are lightly wrinkled with approximately 5 µm or less deflection across 100 µm of travel. This is typically not problematic for high-resolution imaging.

GFLAT silicon oxide films are created by a proprietary process that uniquely results in flat, suspended silicon oxide membranes. These membranes are ideally suited for biological imaging studies, with a glass-like hydrophilic surface. These TEM Windows are essentially micro-scale glass cover slips.
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