Grating Replicas: Parallel and Crossed Lines, Electron Microscopy Sciences

Supplier: Electron Microscopy Sciences
80051 80050
100501-382EA 111.1 USD
100501-382 100501-380
Grating Replicas: Parallel and Crossed Lines, Electron Microscopy Sciences
Graticules, Reticles and Grids
Parallel and crossed line grating replicas are calibration specimens for transmission electron microscopy and scanning transmission electron microscopy.

Parallel: Shadowcast carbon replicas of diffraction parallel line gratings with spacing of 462.9 nm, 2160 lines per millimeter onto 3.05 mm grid.

Crossed: Cross line pitch spacing of 500 nm with 2000 lines/mm in both directions, cross at 90° to one another give additional accuracy to magnification checks and aid in checking distortion. Trench-type groove makes it easy to measure pitch. Ideal for calibration electron-optical magnification up to the ×80000/100000 range.
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